Free Sample Analysis at Ceramics Expo 2018 with JEOL
Visit JEOL at booth 446 for the opportunity to look at samples at ultrahigh magnifications with the company’s new high-resolution, high-throughput Scanning Electron Microscope: the JSM-IT500LA. Additionally, JEOL will hold a live presentation to showcase the SEM at 12.30pm on Tuesday, May 1. This new SEM features the latest innovations from JEOL.
Advanced auto functions and the new ZeroMag feature are designed to make operation accessible to everyone. Navigation across the sample is done with quick and in-focus progression from an optical image to high-resolution SEM imaging and analysis. Analytical capabilities include energy dispersive X-ray spectrometer (EDS) spectra in real time. The SEM features a large sample chamber with multiple ports for additional analytical techniques. To arrange a demo or to bring your own samples, contact JEOL at [email protected], or visit them during the expo.
JEOL USA wll be exhibiting at Ceramics Expo 2018 at Booth 446.